Characterization of Cu(InGa)Se2 (CIGS) Thin Films in Solar Cell Devices by Secondary Ion Mass Spectrometry

Authors
임원철이지혜이연희
Issue Date
2011-03
Citation
Journal of Surface Analysis, v.17, no.3, pp.324 - 327
Keywords
CIGS; Quantitative analysis; depth profiling; Dynamic SIMS
ISSN
1341-1756
URI
https://pubs.kist.re.kr/handle/201004/130551
Appears in Collections:
KIST Article > 2011
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