Perpendicular Magnetic Anisotropy in FePt Patterned Media Employing a CrV Seed Layer
- Authors
- Kim, Hyunsu; Noh, Jin-Seo; Roh, Jong Wook; Chun, Dong Won; Kim, Sungman; Jung, Sang Hyun; Kang, Ho Kwan; Jeong, Won Yong; Lee, Wooyoung
- Issue Date
- 2011-01
- Publisher
- SPRINGER
- Citation
- NANOSCALE RESEARCH LETTERS, v.6
- Abstract
- A thin FePt film was deposited onto a CrV seed layer at 400 degrees C and showed a high coercivity (similar to 3,400 Oe) and high magnetization (900-1,000 emu/cm(3)) characteristic of L1(0) phase. However, the magnetic properties of patterned media fabricated from the film stack were degraded due to the Ar-ion bombardment. We employed a depositionlast process, in which FePt film deposited at room temperature underwent lift-off and post-annealing processes, to avoid the exposure of FePt to Ar plasma. A patterned medium with 100-nm nano-columns showed an out-of-plane coercivity fivefold larger than its in-plane counterpart and a remanent magnetization comparable to saturation magnetization in the out-of-plane direction, indicating a high perpendicular anisotropy. These results demonstrate the high perpendicular anisotropy in FePt patterned media using a Cr-based compound seed layer for the first time and suggest that ultra-high-density magnetic recording media can be achieved using this optimized top-down approach.
- Keywords
- THIN-FILMS; UNDERLAYER; TEMPERATURE; IRRADIATION; COERCIVITY; CrV underlayer; E-beam lithography; FePt; Patterned media
- ISSN
- 1931-7573
- URI
- https://pubs.kist.re.kr/handle/201004/130768
- DOI
- 10.1007/s11671-010-9755-2
- Appears in Collections:
- KIST Article > 2011
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