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dc.contributor.author이득희-
dc.contributor.author김상식-
dc.contributor.author이상렬-
dc.date.accessioned2024-01-20T20:02:31Z-
dc.date.available2024-01-20T20:02:31Z-
dc.date.created2021-09-06-
dc.date.issued2010-01-
dc.identifier.issn1229-2443-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/131803-
dc.description.abstractDesign of experiment (DOE) method is employed for a systematic and highly efficient optimization of Ga-doped ZnO thin films synthesized by pulsed laser deposition (PLD) process. We sequentially adopted fractional-factorial design (FD) and central composite design (CCD) of the DOE methods. In fractional-FD stage,significant factors to make conductive electrode are found to target-substrate (T-S) distance and oxygen partial pressure. Moreover, correlation among the process factors is elucidated using surface profile modeling. Electrical properties of the GZO films grown on a glass substrate had been optimized to find that the lowest electrical resistivity of about 1.8´10-4Wcm which was acquired with the T-S distance and the oxygen pressure of 4 cm and 7 mTorr, respectively. During the DOE-fueled optimization process, the transparency of the GZO films is ensured higher than 85 %.-
dc.languageKorean-
dc.publisher대한전기학회-
dc.titleDOE 법에 의한 Ga 첨가된 ZnO 박막의 공정조건 탐색-
dc.title.alternativeProcess Optimization Approached by Design of Experiment Method for Ga-doped ZnO Thin Films-
dc.typeArticle-
dc.description.journalClass2-
dc.identifier.bibliographicCitation전기학회논문지ABCD, v.59, no.1, pp.108 - 112-
dc.citation.title전기학회논문지ABCD-
dc.citation.volume59-
dc.citation.number1-
dc.citation.startPage108-
dc.citation.endPage112-
dc.identifier.kciidART001413548-
dc.subject.keywordAuthorDOE-
dc.subject.keywordAuthorGa-doped-
dc.subject.keywordAuthorZnO-
dc.subject.keywordAuthorPLD-
dc.subject.keywordAuthorTCO-
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