Nanoanalysis using monochromated and Cs corrected TEM

Other Titles
단파장 전자빔 및 구면수차 보정된 TEM을 이용한 나노 구조분석
Authors
안재평
Issue Date
2009-10
Publisher
대한화학회
Citation
화학세계, v.49, no.11, pp.3 - 6
Keywords
단파장; 구면수차; 투과전자현미경; Monochromatic; Cs corrected
ISSN
1225-004X
URI
https://pubs.kist.re.kr/handle/201004/132052
Appears in Collections:
KIST Article > 2009
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