Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tark, S. J. | - |
dc.contributor.author | Ok, Y. -W. | - |
dc.contributor.author | Kang, M. G. | - |
dc.contributor.author | Lim, H. J. | - |
dc.contributor.author | Kim, W. M. | - |
dc.contributor.author | Kim, D. | - |
dc.date.accessioned | 2024-01-20T20:33:36Z | - |
dc.date.available | 2024-01-20T20:33:36Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2009-10 | - |
dc.identifier.issn | 1385-3449 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/132105 | - |
dc.description.abstract | This study examined the effect of the hydrogen ratio on the electrical and optical properties of hydrogenated Al-doped zinc oxide (AZO) thin films deposited by rf magnetron sputtering using a ceramic target (98 wt% ZnO, 2 wt% Al2O3). Various AZO films on glass were prepared by changing the H-2/(Ar + H-2) ratio at room temperature. The AZO/H films showed a lower resistivity and a higher carrier concentration and mobility than the AZO films. However, the resistivity and mobility of the AZO/H films increased and decreased with increasing H-2 flow ratio, respectively. As a result, the AZO/H films grown with 2% H-2 addition showed excellent electrical properties with a resistivity of 4.98 x 10(4) Omega cm. The UV-measurements showed that the optical transmission of the AZO/H films was > 85% in the visible range with a wide optical band gap. In addition, the effect of H-2 flow ratio on the structure and composition of hydrogenated AZO thin films have also been studied. | - |
dc.language | English | - |
dc.publisher | SPRINGER | - |
dc.subject | TIN-OXIDE-FILMS | - |
dc.subject | THIN-FILMS | - |
dc.subject | ZINC-OXIDE | - |
dc.subject | CONDUCTIVITY | - |
dc.subject | DEPOSITION | - |
dc.subject | SUBSTRATE | - |
dc.subject | GROWTH | - |
dc.title | Effect of a hydrogen ratio in electrical and optical properties of hydrogenated Al-doped ZnO films | - |
dc.type | Article | - |
dc.identifier.doi | 10.1007/s10832-008-9532-0 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTROCERAMICS, v.23, no.2-4, pp.548 - 553 | - |
dc.citation.title | JOURNAL OF ELECTROCERAMICS | - |
dc.citation.volume | 23 | - |
dc.citation.number | 2-4 | - |
dc.citation.startPage | 548 | - |
dc.citation.endPage | 553 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000271982300085 | - |
dc.identifier.scopusid | 2-s2.0-73449144799 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | TIN-OXIDE-FILMS | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | ZINC-OXIDE | - |
dc.subject.keywordPlus | CONDUCTIVITY | - |
dc.subject.keywordPlus | DEPOSITION | - |
dc.subject.keywordPlus | SUBSTRATE | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordAuthor | ZnO | - |
dc.subject.keywordAuthor | Al doping | - |
dc.subject.keywordAuthor | Hydrogenated | - |
dc.subject.keywordAuthor | rf magnetron sputtering | - |
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