Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Kim, Dong Hun | - |
dc.contributor.author | Choi, Seung-Hoon | - |
dc.contributor.author | Cho, Nam Gyu | - |
dc.contributor.author | Chang, YoungEun | - |
dc.contributor.author | Kim, Ho-Gi | - |
dc.contributor.author | Hong, Jae-Min | - |
dc.contributor.author | Kim, Il-Doo | - |
dc.date.accessioned | 2024-01-20T21:30:52Z | - |
dc.date.available | 2024-01-20T21:30:52Z | - |
dc.date.created | 2021-09-01 | - |
dc.date.issued | 2009-06 | - |
dc.identifier.issn | 1099-0062 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/132471 | - |
dc.description.abstract | We report on the fabrication and characterization of sputter-deposited poly(methyl methacrylate) (PMMA) thin films used as gate insulators as well as passivation layers in high performance InGaZnO4 thin-film transistors (TFTs). Sputter-deposited PMMA thin films exhibited a dielectric constant of 4.3 and low leakage current characteristics (<similar to 2x10(-8) A/cm(2) at 0.3 MV/cm). The InGaZnO4 TFTs utilizing PMMA gate insulators and PMMA passivation layers exhibited a high on/off current ratio of 4.08x10(6) and a high field-effect mobility of 36.1 cm(2)/V s. Threshold voltage and field-effect mobility remained constant after aging in air atmosphere for 5 months. | - |
dc.language | English | - |
dc.publisher | ELECTROCHEMICAL SOC INC | - |
dc.subject | FIELD-EFFECT TRANSISTORS | - |
dc.subject | POLYMER | - |
dc.subject | MOBILITY | - |
dc.title | High Stability InGaZnO4 Thin-Film Transistors Using Sputter-Deposited PMMA Gate Insulators and PMMA Passivation Layers | - |
dc.type | Article | - |
dc.identifier.doi | 10.1149/1.3142470 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | ELECTROCHEMICAL AND SOLID STATE LETTERS, v.12, no.8, pp.H296 - H298 | - |
dc.citation.title | ELECTROCHEMICAL AND SOLID STATE LETTERS | - |
dc.citation.volume | 12 | - |
dc.citation.number | 8 | - |
dc.citation.startPage | H296 | - |
dc.citation.endPage | H298 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000266975000018 | - |
dc.identifier.scopusid | 2-s2.0-67649229450 | - |
dc.relation.journalWebOfScienceCategory | Electrochemistry | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalResearchArea | Electrochemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | FIELD-EFFECT TRANSISTORS | - |
dc.subject.keywordPlus | POLYMER | - |
dc.subject.keywordPlus | MOBILITY | - |
dc.subject.keywordAuthor | ageing | - |
dc.subject.keywordAuthor | gallium compounds | - |
dc.subject.keywordAuthor | indium compounds | - |
dc.subject.keywordAuthor | leakage currents | - |
dc.subject.keywordAuthor | passivation | - |
dc.subject.keywordAuthor | permittivity | - |
dc.subject.keywordAuthor | polymer films | - |
dc.subject.keywordAuthor | semiconductor materials | - |
dc.subject.keywordAuthor | sputter deposition | - |
dc.subject.keywordAuthor | thin film transistors | - |
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