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dc.contributor.authorSun, Chang Woo-
dc.contributor.authorLee, Jeong Yong-
dc.contributor.authorKim, Yong Tae-
dc.date.accessioned2024-01-20T22:34:18Z-
dc.date.available2024-01-20T22:34:18Z-
dc.date.created2021-09-03-
dc.date.issued2008-10-
dc.identifier.issn0021-4922-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/133122-
dc.description.abstractThe crystallization tendency and phase transition behavior of Ge-Bi-Te chalcogenide, thin films were investigated with high-resolution transmission electron microscopy. The experimental results show that metastable NaCl changes occur in the stable rhombohedral structure through an intermediate structure with a monoclinic lattice and, secondly, that the motive force of such a phase transformation is the shearing distortion of the metastable structure along the < 100 > direction.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.subjectTRANSMISSION ELECTRON-MICROSCOPY-
dc.subjectTETRADYMITE-LIKE COMPOUNDS-
dc.subjectINTERMETALLIC COMPOUND-
dc.subjectCRYSTAL-STRUCTURES-
dc.subjectX-RAY-
dc.subjectGE2SB2TE5-
dc.subjectDIFFRACTION-
dc.subjectSYSTEM-
dc.subjectCRYSTALLIZATION-
dc.titlePhase Transition Behavior of Ge-Bi-Te Thin Films from an NaCl to Rhombohedral Structure-
dc.typeArticle-
dc.identifier.doi10.1143/JJAP.47.7983-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS, v.47, no.10, pp.7983 - 7985-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.citation.volume47-
dc.citation.number10-
dc.citation.startPage7983-
dc.citation.endPage7985-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000260443900050-
dc.identifier.scopusid2-s2.0-62249172137-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusTRANSMISSION ELECTRON-MICROSCOPY-
dc.subject.keywordPlusTETRADYMITE-LIKE COMPOUNDS-
dc.subject.keywordPlusINTERMETALLIC COMPOUND-
dc.subject.keywordPlusCRYSTAL-STRUCTURES-
dc.subject.keywordPlusX-RAY-
dc.subject.keywordPlusGE2SB2TE5-
dc.subject.keywordPlusDIFFRACTION-
dc.subject.keywordPlusSYSTEM-
dc.subject.keywordPlusCRYSTALLIZATION-
dc.subject.keywordAuthorGe-Bi-Te-
dc.subject.keywordAuthortransition mechanism-
dc.subject.keywordAuthorphase change material-
dc.subject.keywordAuthortransmission electron microscopy-
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