DSpace at KISTKIST Article2008

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dc.contributor.authorJeong, Jung Hwa-
dc.contributor.authorKim, Kyoung Chan-
dc.contributor.authorIl Lee, Jung-
dc.contributor.authorKim, Hyun Jae-
dc.contributor.authorHan, Il Ki-
dc.date.accessioned2024-01-20T23:03:24Z-
dc.date.available2024-01-20T23:03:24Z-
dc.date.created2021-08-31-
dc.date.issued2008-07-
dc.identifier.issn1041-1135-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/133376-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectSUPERLUMINESCENT DIODES-
dc.titleJunction temperature measurement of InAs quanturn-dot laser diodes by utilizing voltage-temperature method-
dc.typeArticle-
dc.identifier.doi10.1109/LPT.2008.926802-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE PHOTONICS TECHNOLOGY LETTERS, v.20, no.13-16, pp.1354 - 1356-
dc.citation.titleIEEE PHOTONICS TECHNOLOGY LETTERS-
dc.citation.volume20-
dc.citation.number13-16-
dc.citation.startPage1354-
dc.citation.endPage1356-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000258505800090-
dc.identifier.scopusid2-s2.0-49349089391-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusSUPERLUMINESCENT DIODES-
dc.subject.keywordAuthorforward voltage-temperature (V-T) method-
dc.subject.keywordAuthorjunction temperature-
dc.subject.keywordAuthorquantum-dot (QD) laser diodes (LDs)-
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