Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Bali, R. | - |
dc.contributor.author | Fleury, E. | - |
dc.contributor.author | Han, S. H. | - |
dc.contributor.author | Ahn, J. P. | - |
dc.date.accessioned | 2024-01-20T23:03:47Z | - |
dc.date.available | 2024-01-20T23:03:47Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 2008-06-12 | - |
dc.identifier.issn | 0925-8388 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/133395 | - |
dc.description.abstract | The microstructure of Sn96.4Ag2.8Cu0.8 (at.%) solder alloy when rapidly quenched onto an Au surface finish has been found to range from nanometer to micrometer-sized features. This striking microstructure contained a spectrum of phases from the Au-Sn phase diagram, while Ag and Cu did not appear to participate in the solidification process. Within the solder contact, a eutectic with 40 nm interlamellar spacing was observed, along with the presence of layered intermetallics. Observations of these phases and their orientation offer better understanding of the solidification of Pb-free solders onto Au. (C) 2007 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | LEAD-FREE SOLDER | - |
dc.subject | FLIP-CHIP | - |
dc.subject | MICROSTRUCTURAL EVOLUTION | - |
dc.subject | TENSILE PROPERTIES | - |
dc.subject | EUTECTIC SNPB | - |
dc.subject | ALLOYS | - |
dc.subject | TECHNOLOGY | - |
dc.subject | CHALLENGES | - |
dc.title | Interfacial intermetallic phases and nanoeutectic in rapidly quenched Sn-Ag-Cu on Au under bump metallization | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.jallcom.2007.02.129 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ALLOYS AND COMPOUNDS, v.457, no.1-2, pp.113 - 117 | - |
dc.citation.title | JOURNAL OF ALLOYS AND COMPOUNDS | - |
dc.citation.volume | 457 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 113 | - |
dc.citation.endPage | 117 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000256124900025 | - |
dc.identifier.scopusid | 2-s2.0-42649110729 | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Metallurgy & Metallurgical Engineering | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Metallurgy & Metallurgical Engineering | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | LEAD-FREE SOLDER | - |
dc.subject.keywordPlus | FLIP-CHIP | - |
dc.subject.keywordPlus | MICROSTRUCTURAL EVOLUTION | - |
dc.subject.keywordPlus | TENSILE PROPERTIES | - |
dc.subject.keywordPlus | EUTECTIC SNPB | - |
dc.subject.keywordPlus | ALLOYS | - |
dc.subject.keywordPlus | TECHNOLOGY | - |
dc.subject.keywordPlus | CHALLENGES | - |
dc.subject.keywordAuthor | microstructure | - |
dc.subject.keywordAuthor | phase diagram | - |
dc.subject.keywordAuthor | transmission electron microscopy | - |
dc.subject.keywordAuthor | TEM | - |
dc.subject.keywordAuthor | scanning electron microscopy | - |
dc.subject.keywordAuthor | SEM | - |
dc.subject.keywordAuthor | laser processing | - |
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