Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Wei, Xiaoding | - |
dc.contributor.author | Lee, Dongyun | - |
dc.contributor.author | Shim, Sanghoon | - |
dc.contributor.author | Chen, Xi | - |
dc.contributor.author | Kysar, Jeffrey W. | - |
dc.date.accessioned | 2024-01-21T00:33:13Z | - |
dc.date.available | 2024-01-21T00:33:13Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2007-09 | - |
dc.identifier.issn | 1359-6462 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/134161 | - |
dc.description.abstract | Free-standing nanocrystalline Cu films with grain size around 39 mn are fabricated by thermal evaporation and characterized by the plane-strain bulge test. Young's modulus and yield stress at a 0.2% offset are about 110-130 GPa and 400 MPa, respectively. Results show that the strength of the n-Cu films is largely independent of film thickness at a strain rate less than 10(-5) s(-1). No grain growth is observed and the predominant plastic deformation mechanism is grain boundary sliding accompanied by dislocation mechanisms. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. | - |
dc.language | English | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.subject | GRAIN-SIZE DEPENDENCE | - |
dc.subject | MECHANICAL-PROPERTIES | - |
dc.subject | PLASTIC-DEFORMATION | - |
dc.subject | TENSILE BEHAVIOR | - |
dc.subject | RATE SENSITIVITY | - |
dc.subject | METALS | - |
dc.subject | GROWTH | - |
dc.subject | PALLADIUM | - |
dc.subject | STRESS | - |
dc.subject | STRENGTH | - |
dc.title | Plain-strain bulge test for nanocrystalline copper thin films | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.scriptamat.2007.05.012 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | SCRIPTA MATERIALIA, v.57, no.6, pp.541 - 544 | - |
dc.citation.title | SCRIPTA MATERIALIA | - |
dc.citation.volume | 57 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 541 | - |
dc.citation.endPage | 544 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000248638600024 | - |
dc.identifier.scopusid | 2-s2.0-34447251637 | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Metallurgy & Metallurgical Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Metallurgy & Metallurgical Engineering | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | GRAIN-SIZE DEPENDENCE | - |
dc.subject.keywordPlus | MECHANICAL-PROPERTIES | - |
dc.subject.keywordPlus | PLASTIC-DEFORMATION | - |
dc.subject.keywordPlus | TENSILE BEHAVIOR | - |
dc.subject.keywordPlus | RATE SENSITIVITY | - |
dc.subject.keywordPlus | METALS | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | PALLADIUM | - |
dc.subject.keywordPlus | STRESS | - |
dc.subject.keywordPlus | STRENGTH | - |
dc.subject.keywordAuthor | nanocrystalline materials | - |
dc.subject.keywordAuthor | thin films | - |
dc.subject.keywordAuthor | bulge test | - |
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