Confinement of charge carriers and excitons in electrophosphorescent devices: Mechanism of light emission and degradation
- Authors
- Chin, Byung Doo; Lee, Changhee
- Issue Date
- 2007-08-17
- Publisher
- WILEY-V C H VERLAG GMBH
- Citation
- ADVANCED MATERIALS, v.19, no.16, pp.2061 - +
- Abstract
- Charge-carrier and exciton confinement is essential for efficiency and stability enhancment of electrophosphorescent devices. Emission-layer lifetimes of a 4,4'-N,N'-dicarbazole-biphenyl host doped with either a red- or green-emitting dye (upper and lower figures) show a strong dependence and near independence, respectively, on the type of exciton blocking layer used (four are shown). This is explained using energy-level differences and corresponding charge-trapping behavior.
- Keywords
- HIGH-EFFICIENCY; TRANSPORT; DIODES; LAYER; HIGH-EFFICIENCY; TRANSPORT; DIODES; LAYER; OLED; Charge Confinement; Exciton; Lifetime; Mechanism
- ISSN
- 0935-9648
- URI
- https://pubs.kist.re.kr/handle/201004/134192
- DOI
- 10.1002/adma.200602509
- Appears in Collections:
- KIST Article > 2007
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.