Real time optical-electrical characterization of PbTe thin film material for super-resolution optical memory

Authors
Lee, Hyun SeokLee, Taek SungJeong, Jeung-hyunLee, SuyounKim, Won MokCheong, Byung-ki
Issue Date
2007-03
Publisher
KOREAN INST METALS MATERIALS
Citation
ELECTRONIC MATERIALS LETTERS, v.3, no.1, pp.13 - 16
Abstract
An experimental study was conducted in an effort to elucidate the origin of the nonlinear optical properties of PbTe thin film, which previously had been demonstrated to be potentially usable for super-resolution optical memory. Using PbTe thin film device designed expressly for the experiment, transient optical transmittance and reflectance were measured together with the electrical voltage across the PbTe during pulsed irradiation with a 658 nm laser of varying power. From the measured data, the absorption coefficient was derived as well as the carrier concentration as a function of laser power, demonstrating vividly that a decrease in the absorption coefficient with increasing laser power is directly related to the increase in photo-generated carriers. The observed correlation underlying the nonlinear optical properties of PbTe may be understood in light of saturable absorption resulting from band filling by carriers photo-generated under thermal influence and is a major cause of the material's super-resolution effect.
Keywords
DATA STORAGE; RESOLUTION; DATA STORAGE; RESOLUTION; optical data storage; super-resolution (SR); PbTe; nonlinear optical property; thermoelectric; absorption saturation; band filling; photo-induced carriers
ISSN
1738-8090
URI
https://pubs.kist.re.kr/handle/201004/134612
Appears in Collections:
KIST Article > 2007
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE