Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, Jae Hong | - |
dc.contributor.author | Kwon, Tae Yun | - |
dc.contributor.author | Kim, Hyung Joon | - |
dc.contributor.author | Kim, Seung Rae | - |
dc.contributor.author | Yoon, Dae Sung | - |
dc.contributor.author | Cheon, Chae-Il | - |
dc.contributor.author | Kim, Hwan | - |
dc.contributor.author | Kim, Tae Song | - |
dc.date.accessioned | 2024-01-21T02:01:47Z | - |
dc.date.available | 2024-01-21T02:01:47Z | - |
dc.date.created | 2021-09-01 | - |
dc.date.issued | 2006-12 | - |
dc.identifier.issn | 1385-3449 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/134884 | - |
dc.description.abstract | The PZT thick film cantilever devices fabricated via MEMS process have much attraction because they are appropriate for biological transducer or sensor, resulting from their large actuating force and relatively high sensitivity especially in liquid. By means of resonance behavior, theoretical calculation and experimental verification of the PZT thick film cantilever devices have not been studied before. Accordingly, we focused on the sensitivity analysis and interpretation of the PZT thick film cantilevers in this study. Especially, the investigation for mass sensitivity of the PZT thick film cantilever is of importance for physical, chemical and biological sensing application. The PZT thick film cantilever devices were constructed on Pt/TiO2/SiNX/Si substrates using screen printing method and MEMS process. The harmonic oscillation response (resonance frequency) was measured using an optical laser interferometric vibrometer. The effect of cantilever geometry on the resonance frequency change was investigated. Compared with the theoretical resonant frequency change by mass loading, the experimental resonant frequency change of the PZT micromechanical thick film cantilever shows a variation of less than 2%. Mass sensitivities are estimated to be 30.7, 57.1 and 152.0 pg/Hz for the 400 x 380 mu m, 400 x 480 mu m and 400 x 580 mu m cantilever, respectively. | - |
dc.language | English | - |
dc.publisher | SPRINGER | - |
dc.subject | SILICON | - |
dc.subject | SYSTEMS | - |
dc.subject | CANTILEVER | - |
dc.title | Resonance properties and mass sensitivity of monolithic microcantilever sensors actuated by piezoelectric PZT thick film | - |
dc.type | Article | - |
dc.identifier.doi | 10.1007/s10832-006-6290-8 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTROCERAMICS, v.17, no.2-4, pp.565 - 572 | - |
dc.citation.title | JOURNAL OF ELECTROCERAMICS | - |
dc.citation.volume | 17 | - |
dc.citation.number | 2-4 | - |
dc.citation.startPage | 565 | - |
dc.citation.endPage | 572 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000243610600082 | - |
dc.identifier.scopusid | 2-s2.0-33847252516 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | SILICON | - |
dc.subject.keywordPlus | SYSTEMS | - |
dc.subject.keywordPlus | CANTILEVER | - |
dc.subject.keywordAuthor | cantilever | - |
dc.subject.keywordAuthor | resonance | - |
dc.subject.keywordAuthor | sensitivity | - |
dc.subject.keywordAuthor | PZT | - |
dc.subject.keywordAuthor | tick film | - |
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