Characteristics of PMW-PNN-PT-PZ thick films on various bottom electrodes

Authors
Kim, Sang-JongKang, Chong-YunChoi, Ji-WonKim, Hyun-JaiSung, Man-YoungYoon, Seok-Jin
Issue Date
2006-12
Publisher
SPRINGER
Citation
JOURNAL OF ELECTROCERAMICS, v.17, no.2-4, pp.495 - 498
Abstract
Characteristics of piezoelectric thick films on various bottom electrodes prepared by screen printing method were investigated. The composition of the ceramics used in this study was 0.01Pb(Mg1/2W1/2)O-3-0.41Pb(Ni1/3Nb2/3)O-3-0.35PbTiO(3)-0.23PbZrO(3) + 0.1wt% Y2O3 +2.0 wt.%ZnO(PMW-PNN-PT-PZ). The Ag and the Ag-Pd electrodes were coated on SiO2/Si substrate by screen printing method and Pt electrode was deposited on Ti/ SiO2/Si substrate by DC sputtering system. The piezoelectric PMW-PNN-PT-PZ thick films were fabricated on each electrode and annealed by rapid thermal annealing (RTA). The PMW-PNN-PT-PZ piezoelectric thick films on Ag/SiO2/Si has higher remanent polarization (P-r) of 22.4 mu C/cm(2).
Keywords
piezoelectric; thick film; screen printing method; rapid thermal annealing
ISSN
1385-3449
URI
https://pubs.kist.re.kr/handle/201004/134909
DOI
10.1007/s10832-006-0468-y
Appears in Collections:
KIST Article > 2006
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