Characteristics of PMW-PNN-PT-PZ thick films on various bottom electrodes
- Authors
- Kim, Sang-Jong; Kang, Chong-Yun; Choi, Ji-Won; Kim, Hyun-Jai; Sung, Man-Young; Yoon, Seok-Jin
- Issue Date
- 2006-12
- Publisher
- SPRINGER
- Citation
- JOURNAL OF ELECTROCERAMICS, v.17, no.2-4, pp.495 - 498
- Abstract
- Characteristics of piezoelectric thick films on various bottom electrodes prepared by screen printing method were investigated. The composition of the ceramics used in this study was 0.01Pb(Mg1/2W1/2)O-3-0.41Pb(Ni1/3Nb2/3)O-3-0.35PbTiO(3)-0.23PbZrO(3) + 0.1wt% Y2O3 +2.0 wt.%ZnO(PMW-PNN-PT-PZ). The Ag and the Ag-Pd electrodes were coated on SiO2/Si substrate by screen printing method and Pt electrode was deposited on Ti/ SiO2/Si substrate by DC sputtering system. The piezoelectric PMW-PNN-PT-PZ thick films were fabricated on each electrode and annealed by rapid thermal annealing (RTA). The PMW-PNN-PT-PZ piezoelectric thick films on Ag/SiO2/Si has higher remanent polarization (P-r) of 22.4 mu C/cm(2).
- Keywords
- piezoelectric; thick film; screen printing method; rapid thermal annealing
- ISSN
- 1385-3449
- URI
- https://pubs.kist.re.kr/handle/201004/134909
- DOI
- 10.1007/s10832-006-0468-y
- Appears in Collections:
- KIST Article > 2006
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