Temperature-dependent switching current of Cr-doped SrZrO3/SrRuO3 deposited for ReRAM applications by using PLD

Authors
Jung, KyoohoSeo, HongwooKim, NambinKim, YongminIm, HyunsikPark, Jae-WanYang, Min KyuLee, Jeon-Kook
Issue Date
2006-09
Publisher
KOREAN PHYSICAL SOC
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.49, no.3, pp.1071 - 1075
Abstract
We have investigated the electrical transport in a Pt/Cr-doped SZO/SRO thin film, which is one of the candidate materials for a resistive RAM (RRAM), deposited by using pulsed laser deposition (PLD) as a function of temperature. A clear current switching between low-resistance ON and high-resistance OFF states is observed. As the temperature is lowered, the ON-to-OFF current ratio is increased. A pulsed voltage with a frequency of 10 Hz similar to 1 kHz is also applied to explore the nonvolatile memory properties, and the transient time is estimated. Stable switching characteristics are observed over the entire range of temperatures and frequencies. Interestingly, the ON-to-OFF current ratio decreases with increasing frequency.
Keywords
ELECTRICAL-PROPERTIES; NEGATIVE-RESISTANCE; THIN-FILMS; MEMORY; ELECTRICAL-PROPERTIES; NEGATIVE-RESISTANCE; THIN-FILMS; MEMORY; resistive switching; perovskite material; non-volatile memory
ISSN
0374-4884
URI
https://pubs.kist.re.kr/handle/201004/135197
Appears in Collections:
KIST Article > 2006
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE