A study of dielectrophoretically aligned gallium nitride nanowires in metal electrodes and their electrical properties

Authors
Lee, S. -Y.Kim, T. -H.Suh, D. -I.Cho, N. -K.Seong, H. -K.Jung, S. -W.Choi, H. -J.Lee, S. -K.
Issue Date
2006-08-18
Publisher
ELSEVIER
Citation
CHEMICAL PHYSICS LETTERS, v.427, no.1-3, pp.107 - 112
Abstract
We quantitatively characterized the ac dielectrophoresis force on semiconducting gallium nitride (GaN) nanowires in suspension with variations of the ac electric field and frequency. The yield of aligned GaN nanowires increased with increasing ac electric field (up to 20 Vp-p). The yield results indicate that the GaN nanowires were well aligned with a high yield of similar to 80% over the entire array in a chip at the frequencies of 10 kHz and 20 MHz. In addition, the electrical properties of GaN nanowires prepared by dielectrophoresis were investigated using conventional three-probe schemes in field-effect transistor structures. (c) 2006 Elsevier B.V. All rights reserved.
Keywords
MANIPULATION; FABRICATION; MANIPULATION; FABRICATION; gallium nitride; nanowires
ISSN
0009-2614
URI
https://pubs.kist.re.kr/handle/201004/135240
DOI
10.1016/j.cplett.2006.05.133
Appears in Collections:
KIST Article > 2006
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE