An analysis of citation counts of ETRI-invented US patents

Authors
Lee, Yong-GilLee, Jeong-DongSong, Yong-Il
Issue Date
2006-08
Publisher
ELECTRONICS TELECOMMUNICATIONS RESEARCH INST
Citation
ETRI JOURNAL, v.28, no.4, pp.541 - 544
Abstract
From its foundation until 2004, ETRI has registered over 1,000 US patents This letter analyzes the characteristics of these patents and addresses the explanatory factors affecting their citation counts. For explanatory variables, research team related variables, invention specific variables, and geographical domain related variables are suggested. Zero-altered count data models are used to test the impact of independent variables. A key finding is that technological cumulativeness, the scale of invention, outputs in the electronic field, and the degree of dependence on the US technology domain positively affect the citation counts of ETRI-invented US patents. The magnitude of international presence appears to negatively affect the citation counts of ETRI-invented US patents.
Keywords
REGRESSION; REGRESSION; ETRI-invented US patents; citation counts; zero-altered model; technological cumulativeness; US technology domain
ISSN
1225-6463
URI
https://pubs.kist.re.kr/handle/201004/135306
DOI
10.4218/etrij.06.0206.0019
Appears in Collections:
KIST Article > 2006
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