Friction mechanisms of silicon wafer and silicon wafer coated with diamond-like carbon film and two monolayers

Authors
Singh, R. ArvindYoon, Eui-SungHan, Hung-GuKong, Hosung
Issue Date
2006-06
Publisher
KOREAN SOC MECHANICAL ENGINEERS
Citation
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, v.20, no.6, pp.738 - 747
Abstract
The friction behaviour of Si-wafer, diamond-like carbon (DLC) and two self-assembled monolayers (SAMs) namely dimethyldichlorosilane (DMDC) and diphenyl-dichlorosilane (DPDC) coated on Si-wafer was studied under loading conditions in milli-newton (mN) range. Experiments were performed using a ball-on-flat type reciprocating micro-tribo tester. Glass balls with various radii 0.25 mm, 0.5 mm and 1 mm were used. The applied normal load was in the range of 1.5 mN to 4.8 mN. Results showed that the friction increased with the applied normal load in the case of all the test materials. It was also observed that friction was affected by the ball size. Friction increased with the increase in the ball size in the case of Si-wafer. The SAMs also showed a similar trend, but had lower values of friction than those of Si-wafer. Interestingly, for DLC it was ob-served that friction decreased with the increase in the ball size. This distinct difference in the behavior of friction in DLC was attributed to the difference in the operating mechanism. It was observed that Si-wafer and DLC exhibited wear, whereas wear was absent in the SAMs. Observations showed that solid-solid adhesion was dominant in Si-wafer, while plowing in DLC. The wear in these two materials significantly influenced their friction. In the case of SAMs their friction behaviour was largely influenced by the nature of their molecular chains.
Keywords
TRIBOLOGICAL BEHAVIOR; SURFACE-CHEMISTRY; NANOSCALE; COATINGS; ADHESION; CONTACT; TRIBOLOGICAL BEHAVIOR; SURFACE-CHEMISTRY; NANOSCALE; COATINGS; ADHESION; CONTACT; friction; wear; tribology; DLC; SAM
ISSN
1738-494X
URI
https://pubs.kist.re.kr/handle/201004/135500
DOI
10.1007/BF02915938
Appears in Collections:
KIST Article > 2006
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