Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique
- Authors
- Gyeungho Kim; Jae-Pyoung Ahn
- Issue Date
- 2006-01
- Publisher
- 한국현미경학회
- Citation
- 한국현미경학회지, v.36, no.2, pp.47 - 56
- Abstract
- Improvements are made to existing primitive cell volume measurement method to provide a real-timeanalysis capability for the phase analysis of nanocrystalline materials. Simplification is introduced in theprimitive cell volume calculation leading to fast and reliable method for nano-phase identification and isapplied to the phase analysis of Mo-Si-N nanocoating layer. In addition, comparison is made between real-timeand film measurements for their accuracy of calculated primitive cell volume values and factors governing theaccuracy of the method are determined. About 5% accuracy in primitive cell determination is obtained fromcamera length calibration and this technique is used to investigate the cell volume variation in WC-TiC core-shell microstructure. In addition to chemical compositional variation in core-shell type structure, primitive cellvolume variation reveals additional information on lattice coherency strain across the interface.
- Keywords
- Convergent beam electron diffraction; Nanophase materials; Primitive cell volumecell is sufficient to provide a primitive cell volume of agiven phase to about 10% accuracy. It should be em-phasized that there is no need to obtain the HOLZ linepatter; Convergent beam electron diffraction; Nanophase materials; Primitive cell volumecell is sufficient to provide a primitive cell volume of agiven phase to about 10% accuracy. It should be em-phasized that there is no need to obtain the HOLZ linepatter
- ISSN
- 2287-5123
- URI
- https://pubs.kist.re.kr/handle/201004/135837
- Appears in Collections:
- KIST Article > 2006
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