FT-IR, XPS and PEC characterization of spray deposited hematite thin films

Abstract

Hematite thin films were prepared by spraying ethanolic solution of ferric trichloride and have been characterized by using Fourier transform infra-red (FT-IR) and X-ray photoelectron spectroscopic (XPS) techniques. The film prepared by spray consists of a single phase of alpha-Fe2O3. The XPS studies confirm that chemical states of Fe3+ and O2- in the film; thereby confirming the formation of the hematite thin films. The photoelectrochemical (PEC) studies have been carried out by forming a three-electrode system using 1 M NaOH electrolyte. The junction is illuminated with white light to obtain I-V characteristics in chopped light. The studies indicate the films exhibit n-type conductivity. (c) 2005 Elsevier B.V. All rights reserved.