Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahn, DH | - |
dc.contributor.author | Kang, DH | - |
dc.contributor.author | Cheong, BK | - |
dc.contributor.author | Kwon, HS | - |
dc.contributor.author | Kwon, MH | - |
dc.contributor.author | Lee, TY | - |
dc.contributor.author | Jeong, JH | - |
dc.contributor.author | Lee, TS | - |
dc.contributor.author | Kim, IH | - |
dc.contributor.author | Kim, KB | - |
dc.date.accessioned | 2024-01-21T05:06:51Z | - |
dc.date.available | 2024-01-21T05:06:51Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 2005-05 | - |
dc.identifier.issn | 0741-3106 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/136523 | - |
dc.description.abstract | A nonvolatile memory technology utilizing reversible changes between fcc and hcp crystalline phases is proposed. In this new type of phase-change memory, data are stored in different forms of crystalline phases of (Ge1Sb2Te4)(0.8)(Sn1Bi2Te4)(0.2) chalcogenide alloy. RESET operation produces the less conductive metastable fcc phase via melt-quenching from the more conductive stable hep phase and SET operation involves a phase change from fcc directly to hcp. Both RESET and SET operations can be completed as fast as 70 ns with large changes in cell resistance. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | THIN-FILM | - |
dc.title | A nonvolatile memory based on reversible phase changes between fcc and hcp | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/LED.2005.846576 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | IEEE ELECTRON DEVICE LETTERS, v.26, no.5, pp.286 - 288 | - |
dc.citation.title | IEEE ELECTRON DEVICE LETTERS | - |
dc.citation.volume | 26 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 286 | - |
dc.citation.endPage | 288 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000228706300003 | - |
dc.identifier.scopusid | 2-s2.0-21044437184 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalResearchArea | Engineering | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordAuthor | amorphous semiconductor | - |
dc.subject.keywordAuthor | chalcogenide | - |
dc.subject.keywordAuthor | non-volatile memory | - |
dc.subject.keywordAuthor | phase transformation | - |
dc.subject.keywordAuthor | phase-change memory (PCM) | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.