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dc.contributor.authorAhn, DH-
dc.contributor.authorKang, DH-
dc.contributor.authorCheong, BK-
dc.contributor.authorKwon, HS-
dc.contributor.authorKwon, MH-
dc.contributor.authorLee, TY-
dc.contributor.authorJeong, JH-
dc.contributor.authorLee, TS-
dc.contributor.authorKim, IH-
dc.contributor.authorKim, KB-
dc.date.accessioned2024-01-21T05:06:51Z-
dc.date.available2024-01-21T05:06:51Z-
dc.date.created2021-09-03-
dc.date.issued2005-05-
dc.identifier.issn0741-3106-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/136523-
dc.description.abstractA nonvolatile memory technology utilizing reversible changes between fcc and hcp crystalline phases is proposed. In this new type of phase-change memory, data are stored in different forms of crystalline phases of (Ge1Sb2Te4)(0.8)(Sn1Bi2Te4)(0.2) chalcogenide alloy. RESET operation produces the less conductive metastable fcc phase via melt-quenching from the more conductive stable hep phase and SET operation involves a phase change from fcc directly to hcp. Both RESET and SET operations can be completed as fast as 70 ns with large changes in cell resistance.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectTHIN-FILM-
dc.titleA nonvolatile memory based on reversible phase changes between fcc and hcp-
dc.typeArticle-
dc.identifier.doi10.1109/LED.2005.846576-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE ELECTRON DEVICE LETTERS, v.26, no.5, pp.286 - 288-
dc.citation.titleIEEE ELECTRON DEVICE LETTERS-
dc.citation.volume26-
dc.citation.number5-
dc.citation.startPage286-
dc.citation.endPage288-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000228706300003-
dc.identifier.scopusid2-s2.0-21044437184-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalResearchAreaEngineering-
dc.type.docTypeArticle-
dc.subject.keywordPlusTHIN-FILM-
dc.subject.keywordAuthoramorphous semiconductor-
dc.subject.keywordAuthorchalcogenide-
dc.subject.keywordAuthornon-volatile memory-
dc.subject.keywordAuthorphase transformation-
dc.subject.keywordAuthorphase-change memory (PCM)-
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