Characteristics of RuO2-SnO2 nanocrystalline-embedded amorphous electrode for thin film microsupercapacitors
- Authors
- Kim, HK; Choi, SH; Yoon, YS; Chang, SY; Ok, YW; Seong, TY
- Issue Date
- 2005-03-22
- Publisher
- ELSEVIER SCIENCE SA
- Citation
- THIN SOLID FILMS, v.475, no.1-2, pp.54 - 57
- Abstract
- The characteristics of RuO2-SnO2 nanocrystalline-embedded amorphous electrode, grown by DC reactive sputtering, was investigated. X-ray diffraction (XRD), transmission electron microscopy (TEM), and transmission electron diffraction (TED) examination results showed that Sn and Ru metal cosputtered electrode in O-2/Ar ambient have RuO2-SnO2 nanocrystallines in an amorphous oxide matrix. It is shown that the cyclic voltammorgram (CV) result of the RuO2-SnO2 nanocrystalline-embedded amorphous film in 0.5 M H2SO4 liquid electrolyte is similar to a bulk-type supercapacitor behavior with a specific capacitance of 62.2 mF/cm(2) mum. This suggests that the RuO2-SnO2 nanocrystalline-embedded amorphous film can be employed in hybrid all-solid state energy storage devises as an electrode of supercapacitor. (C) 2004 Elsevier B.V. All rights reserved.
- Keywords
- OXIDE ELECTRODES; CATHODES; OXIDE ELECTRODES; CATHODES; RuO2; SnO2; nanocrystalline; capacitance; supercapacitor
- ISSN
- 0040-6090
- URI
- https://pubs.kist.re.kr/handle/201004/136636
- DOI
- 10.1016/j.tsf.2004.08.057
- Appears in Collections:
- KIST Article > 2005
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