Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, JH | - |
dc.contributor.author | Jung, JH | - |
dc.contributor.author | Kwack, KD | - |
dc.contributor.author | Kim, TW | - |
dc.contributor.author | Park, YJ | - |
dc.date.accessioned | 2024-01-21T05:45:19Z | - |
dc.date.available | 2024-01-21T05:45:19Z | - |
dc.date.created | 2022-01-10 | - |
dc.date.issued | 2004-12 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/136953 | - |
dc.description.abstract | The coupling effect between an InAs quantum dot and an electric-field-induced quantum dot has been investigated theoretically. When an electric field is applied between a metal probe tip and p-type semiconductor, three-dimensionally curved electric potential is formed beneath the semiconductor sub-surface region of the p-type GaAs. Accordingly, when an electric field is applied between a metal probe tip and p-type GaAs layer including InAs self-assembled quantum dots, the coupling energy states between two kinds of quantum dots, self-assembled InAs quantum dot and electric field-induced quantum dot, are formed. In this article we proved the existence of the coupling states between a single InAs quantum dot and an electric-field-induced quantum dot through the theoretical calculation on the basis of k-p theory and envelope function approximation. For this study, we solved three-dimensional Schrodinger and Poisson equations self-consistently. These results can improve the understanding of the coupling effects on the coupled quantum structures using a metal probe tip and a self-assembled quantum dot. | - |
dc.language | English | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.subject | FORCE MICROSCOPY | - |
dc.title | Coupling effect between InAs quantum dot and electric field-induced quantum dot | - |
dc.type | Article | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.45, pp.S585 - S588 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 45 | - |
dc.citation.startPage | S585 | - |
dc.citation.endPage | S588 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.wosid | 000226119400024 | - |
dc.identifier.scopusid | 2-s2.0-12744271521 | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | FORCE MICROSCOPY | - |
dc.subject.keywordAuthor | nanostructures | - |
dc.subject.keywordAuthor | electronic states | - |
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