Strong blue emission from Er3+ doped in AlxGa1-xN
- Authors
- Wakahara, A; Nakanishi, Y; Fujiwara, T; Okada, H; Yoshida, A; Ohshima, T; Kamiya, T; Kim, YT
- Issue Date
- 2004-09
- Publisher
- WILEY-V C H VERLAG GMBH
- Citation
- PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.201, no.12, pp.2768 - 2772
- Abstract
- Er ions are introduced into AlxGa1-xN (0 less than or equal to x less than or equal to 1) by ion implantation to investigate the effect of Al composition on the luminescence properties of 4f(n) inner-shell transitions of Er3+. Strong and sharp emission peaks attributed to the 4f-4f transition of Er3+ are observed in ultra-violet and blue region (400-550 nm) from the samples with AlN molar fraction of x > 0.3. These photoemissions are assigned as P-2(3/2) - I-4(15/2), P-2(3/2) - I-4(13/2), P-2(3/2) - I-4(11/2), and P-2(3/2) - P-4(11/2) transitions, and the 408 nm emission, corresponding to P-2(3/2) - I-4(13/2) transition, is the strongest in the present work. As increasing the Al composition, the intensity of Er3+-related emissions is rapidly increased and the thermal quenching proper-ties is also improved.
- Keywords
- THIN-FILMS; GAN; PHOTOLUMINESCENCE; CATHODOLUMINESCENCE; ELECTROLUMINESCENCE; LUMINESCENCE; DIODES; THIN-FILMS; GAN; PHOTOLUMINESCENCE; CATHODOLUMINESCENCE; ELECTROLUMINESCENCE; LUMINESCENCE; DIODES
- ISSN
- 1862-6300
- URI
- https://pubs.kist.re.kr/handle/201004/137288
- DOI
- 10.1002/pssa.200405006
- Appears in Collections:
- KIST Article > 2004
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