Time-resolved plasma measurement in a high-power pulsed ICP source for large area

Authors
Kim, YWJung, YDHan, SLee, YKim, GH
Issue Date
2004-08-02
Publisher
ELSEVIER SCIENCE SA
Citation
SURFACE & COATINGS TECHNOLOGY, v.186, no.1-2, pp.161 - 164
Abstract
Spatial and temporal evolution of the plasma parameters in a pulsed inductively coupled discharge for plasma source ion implantation (PSII) process was studied experimentally. Langmuir probe current and voltage measurements were performed to determine the plasma parameters. To measure the time-resolved plasma parameters automatically, data acquisition (DAQ) system was designed using a LabVIEW(R) program and interfaced to a computer with data acquisition card. Time-resolved plasma parameters consisted of two regions: RF pulse ON time and OFF time. Experiments revealed that the plasma parameters reached a steady state at about 500 mus after the RF pulse ON and they shrunk gradually after the end of the RE pulse. It was also observed that the radial and axial profiles of plasma density were uniform in large area plasma chamber at peak RF power below 20 kW. (C) 2004 Elsevier B.V. All rights reserved.
Keywords
LANGMUIR PROBE; REDUCTION; LANGMUIR PROBE; REDUCTION; pulsed plasma; time-resolved Langmuir probe; LabVIEW
ISSN
0257-8972
URI
https://pubs.kist.re.kr/handle/201004/137320
DOI
10.1016/j.surfcoat.2004.04.052
Appears in Collections:
KIST Article > 2004
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