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dc.contributor.authorKim, DH-
dc.contributor.authorKim, B-
dc.contributor.authorPark, JO-
dc.date.accessioned2024-01-21T07:08:20Z-
dc.date.available2024-01-21T07:08:20Z-
dc.date.created2021-09-02-
dc.date.issued2004-05-
dc.identifier.issn1226-4865-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/137633-
dc.description.abstractThe nanoscale sensing and manipulation have become a challenging issue in micro/nanorobotic applications. In particular, a feedback sensor-based manipulation is necessary for realizing an efficient and reliable handling of particles under uncertain environment in a micro/nano scale. This paper presents a piezoresistive MEMS cantilever for nanoscale force measurement in microrobotics. A piezoresistive MEMS cantilever enables sensing of gripping and contact forces in nanonewton resolution by measuring changes in the stress-induced electrical resistances. The calibration of a piezoresistive MEMS cantilever is experimentally carried out. In addition, as part of the work on nanomanipulation with a piezoresistive MEMS cantilever, the analysis on the interaction forces between a tip and a material, and the associated manipulation strategies are investigated. Experiments and simulations show that a piezoresistive MEMS cantilever integrated into a microrobotic system can be effectively used in nanoscale force measurements and a sensor-based manipulation.-
dc.languageEnglish-
dc.publisherKOREAN SOC MECHANICAL ENGINEERS-
dc.subjectMICROMANIPULATION-
dc.subjectNANOROBOTICS-
dc.subjectMICROSCOPE-
dc.titleImplementation of a piezoresistive MEMS cantilever for nanoscale force measurement in micro/nano robotic applications-
dc.typeArticle-
dc.description.journalClass1-
dc.identifier.bibliographicCitationKSME INTERNATIONAL JOURNAL, v.18, no.5, pp.789 - 797-
dc.citation.titleKSME INTERNATIONAL JOURNAL-
dc.citation.volume18-
dc.citation.number5-
dc.citation.startPage789-
dc.citation.endPage797-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.identifier.kciidART001093744-
dc.identifier.wosid000221385500007-
dc.identifier.scopusid2-s2.0-10044268742-
dc.relation.journalWebOfScienceCategoryEngineering, Mechanical-
dc.relation.journalResearchAreaEngineering-
dc.type.docTypeArticle-
dc.subject.keywordPlusMICROMANIPULATION-
dc.subject.keywordPlusNANOROBOTICS-
dc.subject.keywordPlusMICROSCOPE-
dc.subject.keywordAuthorpiezoresistive MEMS cantilever-
dc.subject.keywordAuthoratomic force microscope (AFM)-
dc.subject.keywordAuthormicrorobotics-
dc.subject.keywordAuthormicro force sensing-
dc.subject.keywordAuthorvan der Waals force-
dc.subject.keywordAuthormicro/nano -manipulation-
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