Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Kim, DH | - |
dc.contributor.author | Kim, B | - |
dc.contributor.author | Park, JO | - |
dc.date.accessioned | 2024-01-21T07:08:20Z | - |
dc.date.available | 2024-01-21T07:08:20Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2004-05 | - |
dc.identifier.issn | 1226-4865 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/137633 | - |
dc.description.abstract | The nanoscale sensing and manipulation have become a challenging issue in micro/nanorobotic applications. In particular, a feedback sensor-based manipulation is necessary for realizing an efficient and reliable handling of particles under uncertain environment in a micro/nano scale. This paper presents a piezoresistive MEMS cantilever for nanoscale force measurement in microrobotics. A piezoresistive MEMS cantilever enables sensing of gripping and contact forces in nanonewton resolution by measuring changes in the stress-induced electrical resistances. The calibration of a piezoresistive MEMS cantilever is experimentally carried out. In addition, as part of the work on nanomanipulation with a piezoresistive MEMS cantilever, the analysis on the interaction forces between a tip and a material, and the associated manipulation strategies are investigated. Experiments and simulations show that a piezoresistive MEMS cantilever integrated into a microrobotic system can be effectively used in nanoscale force measurements and a sensor-based manipulation. | - |
dc.language | English | - |
dc.publisher | KOREAN SOC MECHANICAL ENGINEERS | - |
dc.subject | MICROMANIPULATION | - |
dc.subject | NANOROBOTICS | - |
dc.subject | MICROSCOPE | - |
dc.title | Implementation of a piezoresistive MEMS cantilever for nanoscale force measurement in micro/nano robotic applications | - |
dc.type | Article | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | KSME INTERNATIONAL JOURNAL, v.18, no.5, pp.789 - 797 | - |
dc.citation.title | KSME INTERNATIONAL JOURNAL | - |
dc.citation.volume | 18 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 789 | - |
dc.citation.endPage | 797 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.identifier.kciid | ART001093744 | - |
dc.identifier.wosid | 000221385500007 | - |
dc.identifier.scopusid | 2-s2.0-10044268742 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Mechanical | - |
dc.relation.journalResearchArea | Engineering | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | MICROMANIPULATION | - |
dc.subject.keywordPlus | NANOROBOTICS | - |
dc.subject.keywordPlus | MICROSCOPE | - |
dc.subject.keywordAuthor | piezoresistive MEMS cantilever | - |
dc.subject.keywordAuthor | atomic force microscope (AFM) | - |
dc.subject.keywordAuthor | microrobotics | - |
dc.subject.keywordAuthor | micro force sensing | - |
dc.subject.keywordAuthor | van der Waals force | - |
dc.subject.keywordAuthor | micro/nano -manipulation | - |
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