Magnetotransport properties in semimetallic bismuth thin films

Authors
Lee, KIJeun, MHLee, JMChang, JYHan, SHHa, JGLee, WY
Issue Date
2004-04
Publisher
TRANS TECH PUBLICATIONS LTD
Citation
DESIGNING, PROCESSING AND PROPERTIES OF ADVANCED ENGINEERING MATERIALS, PTS 1 AND 2, v.449-4, pp.1061 - 1064
Abstract
The magnetotran sport properties of the electroplated and sputtered Bi thin films have been investigated in the range 4 - 300 K. A marked increase from 5,200 % to 80,000 % in the ordinary magnetoresistance (MR) for the electroplated Bi thin film was observed after thermal anneal at 4 K. The MR ratios for the as-grown and the annealed Bi thin films were found to exhibit 560 % and 590 %, respectively.. at 300 K. On the other hand, the MR for the sputtered Bi film grown by sputtering was hardly observed at 4 and 300 K, whereas the MR ratios after anneal were found to reach 30,000 % at 4 K and 600 % at 300 K. We find that the room temperature MR in the sputtered films depends on the trigonal-axis oriented microstructures and grain size, in contrast to the electroplated films. Our results demonstrate the very large room temperature MR in the electroplated and sputtered Bi thin films, which can be used for spintronic device applications.
Keywords
LARGE MAGNETORESISTANCE; LARGE MAGNETORESISTANCE; semimetal; bismuth; magnetotransport; ordinary magnetoresistance
ISSN
0255-5476
URI
https://pubs.kist.re.kr/handle/201004/137747
DOI
10.4028/www.scientific.net/MSF.449-452.1061
Appears in Collections:
KIST Article > 2004
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