Orientation correction method of distorted samples during in situ deformations using a high resolution EBSD

Abstract

Sample distortions taking place in plate-type specimens during in-situ shear deformation give rise to a misunderstanding of the rotated orientation of the deformed specimens due to their non-even free surfaces in orientation analysis using an electron backscattered diffraction (EBSD). Orientation analysis of the distorted sample is difficult by the general mapping method using an EBSD. An orientation correction method in determining the orientations of the rotated samples using an EBSD was proposed. The specimens designed for shear deformation test were elongated in an in-situ deformation stage equipped on a field emission gun scanning electron microscope (FEG-SEM). The orientations of the distorted specimens probed using an EBSD were corrected by the proposed orientation correction method.