Magnetic properties of perpendicularly magnetized Co/Au multilayers

Abstract

The structural and magnetic properties of [Co(d(Co))/Au(22 Angstrom)] (x 30) multilayers grown by RF sputtering on non-etched Si (100) substrates have been studied. The thicknesses of the Co layers (d(Co)) were 6, 9 and 12 Angstrom. The magnetic properties were investigated by means of an alternating gradient-force magnetometer and magnetic force microscopy. The domain configuration and its dependence on the thickness of the elemental magnetic layer are shown. In addition, the correlation between the shape of the hysteresis loops and the domain configuration at remanence For both in-plane and perpendicular applied magnetic field is discussed. (C) 2002 Elsevier Science B.V. All rights reserved.