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dc.contributor.authorPark, JH-
dc.contributor.authorKim, BK-
dc.contributor.authorPark, JG-
dc.contributor.authorKim, Y-
dc.date.accessioned2024-01-21T11:38:47Z-
dc.date.available2024-01-21T11:38:47Z-
dc.date.created2021-09-05-
dc.date.issued2001-11-
dc.identifier.issn0955-2219-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/140085-
dc.description.abstractElectromagnetic simulation of the quality factor measurement was compared to the measurement with a network analyzer. Scattering matrix S-21 obtained from the network analyzer was compared to the S-21 obtained from the simulation. From electric field distribution, the dominant resonant TE01 delta mode could be easily determined. The effects of the pore and the conductive inclusion inside the dielectric were investigated. The quality factor decreased with the pore and the second phase in the dielectrics. The decrease of quality factor is more significant when dielectric have conductive inclusions inside the dielectric. Due to the limitations in computer resources and analysis time, the size of the inclusions inside the dielectrics in simulation are not actual size. (C) 2001 Elsevier Science Ltd. All rights reserved.-
dc.languageEnglish-
dc.publisherElsevier BV-
dc.titleEffect of microstructure on the microwave properties in dielectric ceramics-
dc.typeArticle-
dc.identifier.doi10.1016/S0955-2219(01)00342-9-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJournal of the European Ceramic Society, v.21, no.15, pp.2669 - 2672-
dc.citation.titleJournal of the European Ceramic Society-
dc.citation.volume21-
dc.citation.number15-
dc.citation.startPage2669-
dc.citation.endPage2672-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000172316400016-
dc.identifier.scopusid2-s2.0-0035194598-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordAuthorcavity resonators-
dc.subject.keywordAuthorelectromagnetic simulation-
dc.subject.keywordAuthormicrowave ceramics-
dc.subject.keywordAuthorquality factor-
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KIST Article > 2001
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