Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, H | - |
dc.contributor.author | Kim, SM | - |
dc.contributor.author | Park, YJ | - |
dc.contributor.author | Kim, EK | - |
dc.date.accessioned | 2024-01-21T11:44:19Z | - |
dc.date.available | 2024-01-21T11:44:19Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 2001-09-01 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/140182 | - |
dc.description.abstract | Using room temperature spectroscopic ellipsometry, we measured the pseudo-dielectric function of self-assembled InAs/GaAs quantum dots at the onset of quantum-dot nucleation in the spectral range from 0.8 to 6 eV. The nominal In coverage varied from 1 to 2.6 ML. In addition to the quantum-dot-related feature at 1.1 eV, we observed two high energy transitions near 1.34 and 1.38 eV which arose from the InAs wetting layer. These two high energy features merged in 1-ML-thick wetting layer. We fitted the dielectric function of InAs wetting layer in the visible range performing multilayer analysis, and found strong excitonic enhancement and blue shift of the E-1 peak. (C) 2001 American Institute of Physics. | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | DIELECTRIC FUNCTION | - |
dc.subject | SPECTROSCOPIC ELLIPSOMETRY | - |
dc.subject | OPTICAL-PROPERTIES | - |
dc.subject | GAAS | - |
dc.subject | GROWTH | - |
dc.subject | STATES | - |
dc.subject | GASB | - |
dc.subject | ALAS | - |
dc.subject | INSB | - |
dc.subject | GAP | - |
dc.title | Ellipsometric study of InAs wetting layer in InAs/GaAs quantum dots at the threshold of quantum dot formation | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.1391413 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF APPLIED PHYSICS, v.90, no.5, pp.2290 - 2295 | - |
dc.citation.title | JOURNAL OF APPLIED PHYSICS | - |
dc.citation.volume | 90 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 2290 | - |
dc.citation.endPage | 2295 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000170593900029 | - |
dc.identifier.scopusid | 2-s2.0-17944368737 | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | DIELECTRIC FUNCTION | - |
dc.subject.keywordPlus | SPECTROSCOPIC ELLIPSOMETRY | - |
dc.subject.keywordPlus | OPTICAL-PROPERTIES | - |
dc.subject.keywordPlus | GAAS | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | STATES | - |
dc.subject.keywordPlus | GASB | - |
dc.subject.keywordPlus | ALAS | - |
dc.subject.keywordPlus | INSB | - |
dc.subject.keywordPlus | GAP | - |
dc.subject.keywordAuthor | ellipsometry | - |
dc.subject.keywordAuthor | InAs wetting layer | - |
dc.subject.keywordAuthor | InAs/GaAs quantum dots | - |
dc.subject.keywordAuthor | dielectric function | - |
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