Effect of columnar defects in YBa2Cu3O7-x ramp-edge Josephson junctions

Authors
Kim, DHLee, CWLee, TWHwang, HGSung, GYChoi, CHHahn, TS
Issue Date
2000-11-13
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.77, no.20, pp.3239 - 3241
Abstract
We investigated the transport properties in YBa2Cu3O7-x (YBCO) ramp-edge Josephson junctions before and after 1.3 GeV Pb-ion irradiation. The barrier of the junctions was formed by structural modification of the ramp-edge surface of the YBCO base electrode. After a dose of similar to 2x10(10) Pb ions/cm(2), both critical current and normal resistance of the junctions increased by similar to 30% and 10%, respectively, except near the transition temperature. We interpret such an enhancement of the critical current as a result of impeding Josephson vortex motion by pinned magnetic flux in the electrodes. (C) 2000 American Institute of Physics. [S0003-6951(00)01846-5].
Keywords
columnar defect; ramp-edge juntion; transport property; critical current; YBa2Cu3O7-x
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/140924
DOI
10.1063/1.1325403
Appears in Collections:
KIST Article > 2000
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