Effect of columnar defects in YBa2Cu3O7-x ramp-edge Josephson junctions
- Authors
- Kim, DH; Lee, CW; Lee, TW; Hwang, HG; Sung, GY; Choi, CH; Hahn, TS
- Issue Date
- 2000-11-13
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.77, no.20, pp.3239 - 3241
- Abstract
- We investigated the transport properties in YBa2Cu3O7-x (YBCO) ramp-edge Josephson junctions before and after 1.3 GeV Pb-ion irradiation. The barrier of the junctions was formed by structural modification of the ramp-edge surface of the YBCO base electrode. After a dose of similar to 2x10(10) Pb ions/cm(2), both critical current and normal resistance of the junctions increased by similar to 30% and 10%, respectively, except near the transition temperature. We interpret such an enhancement of the critical current as a result of impeding Josephson vortex motion by pinned magnetic flux in the electrodes. (C) 2000 American Institute of Physics. [S0003-6951(00)01846-5].
- Keywords
- columnar defect; ramp-edge juntion; transport property; critical current; YBa2Cu3O7-x
- ISSN
- 0003-6951
- URI
- https://pubs.kist.re.kr/handle/201004/140924
- DOI
- 10.1063/1.1325403
- Appears in Collections:
- KIST Article > 2000
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