Surface morphology of polyphenylsilsesquioxanes/hydroxyl-functionalized polystyrene blends investigated by atomic force microscopy

Authors
Kim, DWHwang, SSHong, SMLee, EC
Issue Date
2000-07
Publisher
SOC POLYMER SCIENCE JAPAN
Citation
POLYMER JOURNAL, v.32, no.7, pp.531 - 536
Abstract
Phase separation morphology in the thin blend him of polyphenylsilsesquioxane (PPSQ) and hydroxyl-functionalized polystyrene (PSOH) was investigated. PSOH was synthesized by anionic polymerization and identified with TLC,H-1 NMR, and GPC. The two polymers were dissolved in a common solvent and the thin film was prepared by spincoating. Atomic force microscopy (AFM) has been used to investigate the surface morphology of the thin blend films. In 20% PPSQ and 80% PSOH blends, the PPSQ-rich phase was uniformly dispersed like granules and domain size was as small as 100 nm. Comparing it with the PPSQ/PS blend with the same content of PPSQ, the domain size is about one third of that of the PPSQ/PS blend. This enhanced miscibility is believed to result from intermolecular hydrogen bonding between the PPSQ phase and the PSOH phase, which was verified by IR investigation. However, the PPSQ/PSOH (80/ 20) blend showed morphology of the so large domain distributed irregularly. The size of dispersed phase ranged from 500 nm to 1500 nm.
Keywords
BONDED POLYMER BLENDS; GROUP ACCESSIBILITY; POLY(PHENYLSILSESQUIOXANE); TRICHLOROPHENYLSILANE; POLYSILSESQUIOXANES; POLYCONDENSATION; MISCIBILITY; COPOLYMERS; FILMS; AFM; BONDED POLYMER BLENDS; GROUP ACCESSIBILITY; POLY(PHENYLSILSESQUIOXANE); TRICHLOROPHENYLSILANE; POLYSILSESQUIOXANES; POLYCONDENSATION; MISCIBILITY; COPOLYMERS; FILMS; AFM; hydroxyl-functionalized polystyrene; polyphenylsilsquioxanes; atomic force microscopy; phase behavior; surface morphology
ISSN
0032-3896
URI
https://pubs.kist.re.kr/handle/201004/141270
DOI
10.1295/polymj.32.531
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KIST Article > 2000
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