Effect of sputtering input power on structural inhomogeneities in as-sputtered Fe-Hf-N thin films

Authors
Kim, KHKim, YHKim, JHan, SHKim, HJ
Issue Date
2000-06
Publisher
ELSEVIER SCIENCE BV
Citation
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.215, pp.368 - 371
Abstract
The magnetic properties of Fe-Hf-N thin films, deposited by a reactive RF magnetron sputtering method, depend on input powers (150, 300, 450, 550 W). The gamma'-Fe4N phase is observed in all samples by TEM and ESCA, FMR results also show extra resonance peaks with weak intensity, observed at a higher field than that of main mode-(alpha-Fe) except 450 W. The calculated frequency dependency of permeability does not coincide with experimental values except 450 W. These discrepancies are expected to be due to the local anisotropy created by an inhomogeneous magnetic phase. (C) 2000 Published by Elsevier Science B.V. All rights reserved.
Keywords
FERROMAGNETIC-RESONANCE; MAGNETIC-PROPERTIES; FERROMAGNETIC-RESONANCE; MAGNETIC-PROPERTIES; nanocrystalline; ferromagnetic resonance
ISSN
0304-8853
URI
https://pubs.kist.re.kr/handle/201004/141369
DOI
10.1016/S0304-8853(00)00161-X
Appears in Collections:
KIST Article > 2000
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE