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Microstructural Observation of Phase Change Optical Disk by TEM

Other Titles

투과전자현미경을 이용한 상전이형 광디스크의 미세조직 관찰

Authors

김수철; 김긍호

Issue Date

1999-12

Publisher

한국전자현미경학회

Citation

한국전자현미경학회지, v.29, no.4, pp.493 - 498

Keywords

optical disk; TEM; sample preparation; ion milling

ISSN

1225-6773

URI

https://pubs.kist.re.kr/handle/201004/141788

Appears in Collections:

KIST Article > Others

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