Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Son, JY | - |
dc.contributor.author | Strilets, IA | - |
dc.contributor.author | Chun, JH | - |
dc.contributor.author | Shin, S | - |
dc.contributor.author | Choi, YJ | - |
dc.contributor.author | Lee, HS | - |
dc.date.accessioned | 2024-01-21T15:12:10Z | - |
dc.date.available | 2024-01-21T15:12:10Z | - |
dc.date.created | 2021-09-05 | - |
dc.date.issued | 1999-07-22 | - |
dc.identifier.issn | 0013-5194 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/142048 | - |
dc.description.abstract | The intensity difference between counterpropagating waves in ring lasers with back-reflection waves from external mirrors is analysed to enable a highly accurate measurement of displacement to be obtained. The difference is expressed as a periodic function of the distances between the ring laser mirrors and their corresponding mirrors. The measurement accuracy attainable with the difference can be in the sub-nanometre range. | - |
dc.language | English | - |
dc.publisher | IEE-INST ELEC ENG | - |
dc.title | Possibility of measuring displacement with sub-nanometre accuracy by ring laser operating in lock-in regime | - |
dc.type | Article | - |
dc.identifier.doi | 10.1049/el:19990878 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | ELECTRONICS LETTERS, v.35, no.15, pp.1258 - 1260 | - |
dc.citation.title | ELECTRONICS LETTERS | - |
dc.citation.volume | 35 | - |
dc.citation.number | 15 | - |
dc.citation.startPage | 1258 | - |
dc.citation.endPage | 1260 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000081960100035 | - |
dc.identifier.scopusid | 2-s2.0-0032638968 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalResearchArea | Engineering | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | ring laser | - |
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