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dc.contributor.authorSon, JY-
dc.contributor.authorStrilets, IA-
dc.contributor.authorChun, JH-
dc.contributor.authorShin, S-
dc.contributor.authorChoi, YJ-
dc.contributor.authorLee, HS-
dc.date.accessioned2024-01-21T15:12:10Z-
dc.date.available2024-01-21T15:12:10Z-
dc.date.created2021-09-05-
dc.date.issued1999-07-22-
dc.identifier.issn0013-5194-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/142048-
dc.description.abstractThe intensity difference between counterpropagating waves in ring lasers with back-reflection waves from external mirrors is analysed to enable a highly accurate measurement of displacement to be obtained. The difference is expressed as a periodic function of the distances between the ring laser mirrors and their corresponding mirrors. The measurement accuracy attainable with the difference can be in the sub-nanometre range.-
dc.languageEnglish-
dc.publisherIEE-INST ELEC ENG-
dc.titlePossibility of measuring displacement with sub-nanometre accuracy by ring laser operating in lock-in regime-
dc.typeArticle-
dc.identifier.doi10.1049/el:19990878-
dc.description.journalClass1-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.35, no.15, pp.1258 - 1260-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume35-
dc.citation.number15-
dc.citation.startPage1258-
dc.citation.endPage1260-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000081960100035-
dc.identifier.scopusid2-s2.0-0032638968-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalResearchAreaEngineering-
dc.type.docTypeArticle-
dc.subject.keywordAuthorring laser-
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