Parameter extraction in non-ideal thermionic emission diodes

Authors
Lee, JIBrini, JBoussey, JDimitriadis, CA
Issue Date
1999-04
Publisher
ELSEVIER
Citation
APPLIED SURFACE SCIENCE, v.142, no.1-4, pp.481 - 484
Abstract
Novel and simple, on-site extraction method of parameters; the ideality factor, series resistance, leakage resistance, and saturation current, from both the forward and the reverse current-voltage characteristics and their derivatives of non-ideal thermionic emission diodes is presented. The results of successful application of the method on sets of different metal/n-Si Schottky diodes and p-n junction diodes are reported and discussed. (C) 1999 Elsevier Science B.V. All rights reserved.
Keywords
SCHOTTKY-BARRIER DIODES; CONTACTS; SCHOTTKY-BARRIER DIODES; CONTACTS; parameter extraction; thermionic emission; Schottky diode; p-n junction diode; series resistance; leakage current
ISSN
0169-4332
URI
https://pubs.kist.re.kr/handle/201004/142321
DOI
10.1016/S0169-4332(98)00724-7
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KIST Article > Others
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