Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이연희 | - |
| dc.contributor.author | 한승희 | - |
| dc.contributor.author | 윤정현 | - |
| dc.contributor.author | 임현의 | - |
| dc.contributor.author | 조정희 | - |
| dc.date.accessioned | 2024-01-21T16:08:27Z | - |
| dc.date.available | 2024-01-21T16:08:27Z | - |
| dc.date.created | 2022-01-10 | - |
| dc.date.issued | 1999-01 | - |
| dc.identifier.issn | 1341-1756 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/142552 | - |
| dc.title | Studies of polystyrenes using time-of-flight secondary ion mass spectrometry | - |
| dc.type | Article | - |
| dc.description.journalClass | 3 | - |
| dc.identifier.bibliographicCitation | Journal of Surface Analysis, v.6, no.1, pp.50 - 53 | - |
| dc.citation.title | Journal of Surface Analysis | - |
| dc.citation.volume | 6 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 50 | - |
| dc.citation.endPage | 53 | - |
| dc.subject.keywordAuthor | TOF-SIMS | - |
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