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dc.contributor.authorLee, N.Y.-
dc.contributor.authorKim, B.C.-
dc.contributor.authorJung, J.H.-
dc.contributor.authorKang, M.S.-
dc.contributor.authorKim, H.-
dc.contributor.authorJu, B.K.-
dc.contributor.authorLee, Y.H.-
dc.contributor.authorOh, M.H.-
dc.contributor.authorJang, J.-
dc.contributor.authorAhn, S.-
dc.date.accessioned2024-01-21T16:12:57Z-
dc.date.available2024-01-21T16:12:57Z-
dc.date.created2021-09-02-
dc.date.issued1999-01-
dc.identifier.issn1071-0922-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/142631-
dc.description.abstractA 3.5-in. full-color field-emission display (FED) has been developed. The Spindt-tip array with a pixelated anode produces uniform and clean image. Changes in electron emission characteristics before and after the frit-sealing cycle were measured on the same field-emitter arrays (FEAs). Properties of thin Mo films after frit sealing in various gaseous ambients were estimated by AFM, AES, SIMS, and XPS. The possibility of applying Ar as an ambient gas during the frit-sealing cycle for vacuum packaging of field emission displays (FEDs) was reported. A set of uniquely printed spacers with high aspect ratios was fabricated on ITO-coated glass for high-vacuum packaging. The low-voltage phosphor was tested at an anode voltage of 300 V. Finally, full-color images of 64 gray scales will be demonstrated.-
dc.languageEnglish-
dc.publisherSID, Santa Ana-
dc.subjectAtomic force microscopy-
dc.subjectAuger electron spectroscopy-
dc.subjectElectron emission-
dc.subjectMolybdenum-
dc.subjectOptical glass-
dc.subjectSecondary ion mass spectrometry-
dc.subjectThin film devices-
dc.subjectX ray photoelectron spectroscopy-
dc.subjectField emission arrays (FEA)-
dc.subjectFrit-sealing cycle-
dc.subjectField emission cathodes-
dc.titleInfluence of ambient gases during the frit-sealing cycle on the emission characteristics of Mo-FEAs-
dc.typeArticle-
dc.identifier.doi10.1889/1.1985288-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJournal of the Society for Information Display, v.7, no.4, pp.245 - 248-
dc.citation.titleJournal of the Society for Information Display-
dc.citation.volume7-
dc.citation.number4-
dc.citation.startPage245-
dc.citation.endPage248-
dc.description.journalRegisteredClassscopus-
dc.identifier.scopusid2-s2.0-6744243286-
dc.type.docTypeArticle-
dc.subject.keywordPlusAtomic force microscopy-
dc.subject.keywordPlusAuger electron spectroscopy-
dc.subject.keywordPlusElectron emission-
dc.subject.keywordPlusMolybdenum-
dc.subject.keywordPlusOptical glass-
dc.subject.keywordPlusSecondary ion mass spectrometry-
dc.subject.keywordPlusThin film devices-
dc.subject.keywordPlusX ray photoelectron spectroscopy-
dc.subject.keywordPlusField emission arrays (FEA)-
dc.subject.keywordPlusFrit-sealing cycle-
dc.subject.keywordPlusField emission cathodes-
dc.subject.keywordAuthorFED-
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