Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Na, JG | - |
dc.contributor.author | Park, CH | - |
dc.contributor.author | Heo, NH | - |
dc.contributor.author | Lee, SR | - |
dc.contributor.author | Kim, J | - |
dc.contributor.author | Park, K | - |
dc.date.accessioned | 2024-01-21T16:39:15Z | - |
dc.date.available | 2024-01-21T16:39:15Z | - |
dc.date.created | 2021-09-03 | - |
dc.date.issued | 1998-10 | - |
dc.identifier.issn | 0957-4522 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/142846 | - |
dc.description.abstract | Cobalt ferrite/metal composite thin films with a saturation magnetization (M-s) of similar to 0.729 Weber m(-2) were prepared by a reactive sputtering method. The M-s of the thin films increased with increasing substrate temperature. The microstructures of the thin films were identified by a convergent beam electron diffraction method. For the thin films deposited at high substrate temperatures ( >300 degrees C), CoxFe1-x (x approximate to 0.62) metal alloys were separated from the cobalt ferrite matrix. A cobalt ferrite phase was determined as CoFe2O4 with a cubic structure (a(0) = 0.839 nm) and a space group of Fd3m, while a metal phase CoxFe1-x (x approximate to 0.62) with a b.c.c. structure (a(0) = 0.289 nm) and a space group of lm3m. (C) 1998 Kluwer Academic Publishers. | - |
dc.language | English | - |
dc.publisher | KLUWER ACADEMIC PUBL | - |
dc.subject | PATTERNS | - |
dc.title | Phase identification of cobalt ferrite/metal composite thin films using convergent beam electron diffraction | - |
dc.type | Article | - |
dc.identifier.doi | 10.1023/A:1008998800655 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.9, no.5, pp.323 - 326 | - |
dc.citation.title | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | - |
dc.citation.volume | 9 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 323 | - |
dc.citation.endPage | 326 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000077311000001 | - |
dc.identifier.scopusid | 2-s2.0-0032182806 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | PATTERNS | - |
dc.subject.keywordAuthor | thin films | - |
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