DSpace at KIST: Characterization of Ge-Sb-Te Films for Phase-Change Optical Memory

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DC Field	Value	Language
dc.contributor.author	박성진	-
dc.contributor.author	이순일	-
dc.contributor.author	오수기	-
dc.contributor.author	김원목	-
dc.contributor.author	정병기	-
dc.contributor.author	정문교	-
dc.contributor.author	김순광	-
dc.date.accessioned	2024-01-21T17:07:49Z	-
dc.date.available	2024-01-21T17:07:49Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1998-05	-
dc.identifier.issn	1013-7009	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/143094	-
dc.title	Characterization of Ge-Sb-Te Films for Phase-Change Optical Memory	-
dc.title.alternative	상변화형 광디스크에 사용되는 Ge-Sb-Te 박막의 특성 분석	-
dc.type	Article	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	응용물리, v.11, no.3, pp.359 - 364	-
dc.citation.title	응용물리	-
dc.citation.volume	11	-
dc.citation.number	3	-
dc.citation.startPage	359	-
dc.citation.endPage	364	-
dc.subject.keywordAuthor	상변화	-

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