Surface studies of plasma source ion implantation treated polystyrene

Authors
Lee, YHan, SHLee, JHYoon, JHLim, HEKim, KJ
Issue Date
1998-05
Publisher
AMER INST PHYSICS
Citation
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.16, no.3, pp.1710 - 1715
Abstract
The plasma source ion implantation (PSII) was utilized to improve the wettability and the stability of surface layer formed in the modification of polymeric materials. Polystyrene was treated with different kinds of plasma ions to render the surface more hydrophilic or hydrophobic. Hydrophobic recovery of PSII-treated polystyrene was also observed as a function of aging time, aging temperature, and treatment parameters. Treatment parameters involve kinds of gases, pressure, plasma power, pulse frequency, pulse voltage, etc. To study the effect of inert gas on hydrophobic recovery, polystyrene samples were prepared by helium, argon, or gas-mixture treatment. Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has been used to interpret the PSII-treated polystyrene surface and its hydrophobic recovery, with the assistance of x-ray photoelectron spectroscopy and water contact angle measurements. TOF-SIMS spectra of O-18(2) PSII-treated samples showed the presence of O-18-containing peaks from the modified surfaces. PSII modifications provide more stable surfaces of polystyrene as a function of aging time than plasma treatments. The comparison of aging behavior data allowed for examination of the differences in the stability of the functionality introduced by the two different treatment techniques. (C) 1998 American Vacuum Society.
Keywords
POLYPROPYLENE; OXYGEN; POLYPROPYLENE; OXYGEN; plasma source ion implantation
ISSN
0734-2101
URI
https://pubs.kist.re.kr/handle/201004/143096
DOI
10.1116/1.581289
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KIST Article > Others
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