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dc.contributor.authorChoi, WK-
dc.contributor.authorCho, JS-
dc.contributor.authorCho, J-
dc.contributor.authorChoi, SC-
dc.contributor.authorJung, HJ-
dc.contributor.authorKoh, SK-
dc.contributor.authorLee, CM-
dc.contributor.authorJeong, K-
dc.date.accessioned2024-01-21T18:10:00Z-
dc.date.available2024-01-21T18:10:00Z-
dc.date.created2021-09-05-
dc.date.issued1997-08-
dc.identifier.issn0374-4884-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143684-
dc.description.abstractThe Auger spectra of tin, the oxides SnO2, and the nonstoichiometric SnOx thin films grown by reactive ion-assisted deposition have been studied. The Anger transition peaks of O K L2,3L2,3 and Sn M4N4,5N4,5 were used to determine the surface composition and Sn valency for the different tin oxides. Chemical shifts on the order of 1.08-1.1 eV per Sn valency were observed.-
dc.languageEnglish-
dc.publisherKOREAN PHYSICAL SOC-
dc.subjectPARAMETERS-
dc.titleAuger electron spectroscopy investigation of the chemical shifts of tin and tin oxides-
dc.typeArticle-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.31, no.2, pp.369 - 372-
dc.citation.titleJOURNAL OF THE KOREAN PHYSICAL SOCIETY-
dc.citation.volume31-
dc.citation.number2-
dc.citation.startPage369-
dc.citation.endPage372-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1997XR35900024-
dc.identifier.scopusid2-s2.0-0031519289-
dc.relation.journalWebOfScienceCategoryPhysics, Multidisciplinary-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusPARAMETERS-
dc.subject.keywordAuthorreactive ion-assisted deposition-
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