Full metadata record

DC Field Value Language
dc.contributor.authorLee, JY-
dc.contributor.authorHahn, TS-
dc.contributor.authorChoi, SS-
dc.date.accessioned2024-01-21T18:10:44Z-
dc.date.available2024-01-21T18:10:44Z-
dc.date.created2021-09-01-
dc.date.issued1997-08-
dc.identifier.issn0921-4534-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143696-
dc.description.abstractThe possibility of obtaining penetration depth measurement for double sided superconductor film by using two-coil method is investigated. The simulation of screening current density distribution in both layers of film and the inductance of pick-up coil are made. The screening current density of lower film layer, the one farther away from the drive coil than upper film layer due to a substrate with thickness 0.5 mm, is approximately 1000 times smaller than that of the upper layer. The inductance of pick-up coil strongly depends on the penetration depth of upper layer only. In particular, its dependence on the penetration depth of lower layer is negligibly small when drive coil and pick-up coil are positioned at the same side of the film. Therefore, the penetration depth of each film layer can be determined by two separate measurements, one measurement for each side.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectPENETRATION DEPTH-
dc.titleInductive response of double sided superconductor film-
dc.typeArticle-
dc.identifier.doi10.1016/S0921-4534(97)00835-6-
dc.description.journalClass1-
dc.identifier.bibliographicCitationPHYSICA C, v.282, pp.1461 - 1462-
dc.citation.titlePHYSICA C-
dc.citation.volume282-
dc.citation.startPage1461-
dc.citation.endPage1462-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1997XZ90600170-
dc.identifier.scopusid2-s2.0-17144443160-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordPlusPENETRATION DEPTH-
dc.subject.keywordAuthorsuperconductor film-
dc.subject.keywordAuthorpemetration depth-
dc.subject.keywordAuthortwo coil screening current-
Appears in Collections:
KIST Article > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE