Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, JY | - |
dc.contributor.author | Hahn, TS | - |
dc.contributor.author | Choi, SS | - |
dc.date.accessioned | 2024-01-21T18:10:44Z | - |
dc.date.available | 2024-01-21T18:10:44Z | - |
dc.date.created | 2021-09-01 | - |
dc.date.issued | 1997-08 | - |
dc.identifier.issn | 0921-4534 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/143696 | - |
dc.description.abstract | The possibility of obtaining penetration depth measurement for double sided superconductor film by using two-coil method is investigated. The simulation of screening current density distribution in both layers of film and the inductance of pick-up coil are made. The screening current density of lower film layer, the one farther away from the drive coil than upper film layer due to a substrate with thickness 0.5 mm, is approximately 1000 times smaller than that of the upper layer. The inductance of pick-up coil strongly depends on the penetration depth of upper layer only. In particular, its dependence on the penetration depth of lower layer is negligibly small when drive coil and pick-up coil are positioned at the same side of the film. Therefore, the penetration depth of each film layer can be determined by two separate measurements, one measurement for each side. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | PENETRATION DEPTH | - |
dc.title | Inductive response of double sided superconductor film | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/S0921-4534(97)00835-6 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | PHYSICA C, v.282, pp.1461 - 1462 | - |
dc.citation.title | PHYSICA C | - |
dc.citation.volume | 282 | - |
dc.citation.startPage | 1461 | - |
dc.citation.endPage | 1462 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | A1997XZ90600170 | - |
dc.identifier.scopusid | 2-s2.0-17144443160 | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | PENETRATION DEPTH | - |
dc.subject.keywordAuthor | superconductor film | - |
dc.subject.keywordAuthor | pemetration depth | - |
dc.subject.keywordAuthor | two coil screening current | - |
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