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dc.contributor.authorKim, SH-
dc.contributor.authorChoi, YS-
dc.contributor.authorKim, CE-
dc.contributor.authorOh, YJ-
dc.date.accessioned2024-01-21T18:15:27Z-
dc.date.available2024-01-21T18:15:27Z-
dc.date.created2021-09-05-
dc.date.issued1997-06-
dc.identifier.issn0884-2914-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143776-
dc.description.abstractPb(Zr0.52Ti0.48)O-3 (PZT) thin film on Pt/RuO2 double electrode was successfully prepared by using a new alkoxide-alkanolamine, sol-gel method. It was observed that the use of Pt/RuO2 double electrode reduced leakage current, resulting in a marked improvement in the leakage characteristics and more reliable capacitors. Typical P-E hysteresis behavior was observed even at low applied voltage of 5 V, manifesting greatly improved remanence and coercivity, Fatigue and breakdown characteristics, measured at 5 V, showed stable behavior, and no degradation in polarization was observed up to 10(11) cycles.-
dc.languageEnglish-
dc.publisherMATERIALS RESEARCH SOCIETY-
dc.titlePreparation of Pb(Zr0.52Ti0.48)O-3 thin films on Pt/RuO2 double electrode by a new sol-gel route-
dc.typeArticle-
dc.identifier.doi10.1557/JMR.1997.0216-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS RESEARCH, v.12, no.6, pp.1576 - 1581-
dc.citation.titleJOURNAL OF MATERIALS RESEARCH-
dc.citation.volume12-
dc.citation.number6-
dc.citation.startPage1576-
dc.citation.endPage1581-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1997XC34400024-
dc.identifier.scopusid2-s2.0-0031166972-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordAuthorPZT thin film-
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