Novel impurity-free interdiffusion in GaAs/AlGaAs quantum wells by anodization and rapid thermal annealing

Authors
Yuan, SKim, YJagadish, CBurke, PTGal, MZou, JCai, DQCockayne, DJHCohen, RM
Issue Date
1997-03-10
Publisher
AMER INST PHYSICS
Citation
APPLIED PHYSICS LETTERS, v.70, no.10, pp.1269 - 1271
Abstract
A novel impurity-free interdiffusion technique utilizing pulsed anodization and subsequent rapid thermal annealing at temperatures near 900 degrees C was reported. Enhanced interdiffusion was observed in the presence of an anodized GaAs capping layer in GaAs/AlGaAs quantum well structures. Transmission electron microscopy studies show evidence of interdiffusion. Photoluminescence spectra from interdiffused samples show large blue shift and no significant linewidth broadening. possible mechanism of interdiffusion was discussed. (C) 1997 American Institute of Physics.
Keywords
LASERS; GAAS; FABRICATION; DIFFUSION; OXIDATION; SINGLE; LASERS; GAAS; FABRICATION; DIFFUSION; OXIDATION; SINGLE; GaAs; AlGaAs; impurity-free interdiffusion; quantum well; anodic oxide
ISSN
0003-6951
URI
https://pubs.kist.re.kr/handle/201004/143895
DOI
10.1063/1.118549
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KIST Article > Others
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