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dc.contributor.authorKim, SH-
dc.contributor.authorKim, CE-
dc.contributor.authorOh, YJ-
dc.date.accessioned2024-01-21T18:39:09Z-
dc.date.available2024-01-21T18:39:09Z-
dc.date.created2022-01-11-
dc.date.issued1997-02-15-
dc.identifier.issn0261-8028-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143947-
dc.languageEnglish-
dc.publisherSPRINGER-
dc.subjectZIRCONATE-TITANATE FILMS-
dc.titleInfluence of Al2O3 buffer layer on the crystalline structure and dielectric property of PbTiO3 thin film by sol-gel processing-
dc.typeArticle-
dc.identifier.doi10.1023/A:1018528529553-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS SCIENCE LETTERS, v.16, no.4, pp.257 - 259-
dc.citation.titleJOURNAL OF MATERIALS SCIENCE LETTERS-
dc.citation.volume16-
dc.citation.number4-
dc.citation.startPage257-
dc.citation.endPage259-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1997WJ85000004-
dc.identifier.scopusid2-s2.0-0343074926-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordPlusZIRCONATE-TITANATE FILMS-
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