Full metadata record

DC Field Value Language
dc.contributor.authorHan, IK-
dc.contributor.authorWoo, DH-
dc.contributor.authorKim, HJ-
dc.contributor.authorKim, EK-
dc.contributor.authorLee, JI-
dc.contributor.authorKim, SH-
dc.contributor.authorKang, KN-
dc.contributor.authorLim, H-
dc.contributor.authorPark, HL-
dc.date.accessioned2024-01-21T19:11:51Z-
dc.date.available2024-01-21T19:11:51Z-
dc.date.created2021-09-04-
dc.date.issued1996-10-01-
dc.identifier.issn0021-8979-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/144272-
dc.description.abstractThe effect of sulfur (S) treatments on InP is investigated by low-temperature photoluminescence (PL) measurements. For both n- and p-InP, the PL intensity is observed to increase about four times in magnitude if the scattering by Ihs: S overlayer is relatively small. Some PL bands are observed to disappear after S treatments and then reappear if the S-treated surface is heat treated at 220 degrees C in a vacuum of 10(-3) Torr. By observing their dependence on the excitation power density, the doping level of the samples, and measurement temperature, these PL bands are ascribed to the optical transitions via surface states. Our results thus indicate that the S-treated InP surface may not be stable al a subsequent processing temperature of about 250 degrees C. (C) 1996 American Institute of Physics.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.subjectP-TYPE INP-
dc.subjectN-TYPE-
dc.subjectPASSIVATED INP(100)-(1X1)-
dc.subjectELECTRONIC-PROPERTIES-
dc.subjectSCHOTTKY CONTACTS-
dc.subjectSULFIDE LAYERS-
dc.subjectSURFACE-STATES-
dc.subjectGAAS-
dc.subjectIN0.5GA0.5P-
dc.subject(NH4)2SX-
dc.titleThermal stability of sulfur-treated InP investigated by photoluminescence-
dc.typeArticle-
dc.identifier.doi10.1063/1.363366-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.80, no.7, pp.4052 - 4057-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume80-
dc.citation.number7-
dc.citation.startPage4052-
dc.citation.endPage4057-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1996VL80100065-
dc.identifier.scopusid2-s2.0-0011078710-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusP-TYPE INP-
dc.subject.keywordPlusN-TYPE-
dc.subject.keywordPlusPASSIVATED INP(100)-(1X1)-
dc.subject.keywordPlusELECTRONIC-PROPERTIES-
dc.subject.keywordPlusSCHOTTKY CONTACTS-
dc.subject.keywordPlusSULFIDE LAYERS-
dc.subject.keywordPlusSURFACE-STATES-
dc.subject.keywordPlusGAAS-
dc.subject.keywordPlusIN0.5GA0.5P-
dc.subject.keywordPlus(NH4)2SX-
dc.subject.keywordAuthorsulfur passivation-
Appears in Collections:
KIST Article > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE