DSpace at KIST: Measurement of lattice parameter of primary Si crystal in rheocast hypereutectic Al-Si alloy by convergent beam electron diffraction technique.

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DC Field	Value	Language
dc.contributor.author	김긍호	-
dc.contributor.author	이호인	-
dc.contributor.author	이정일	-
dc.date.accessioned	2024-01-21T21:02:12Z	-
dc.date.available	2024-01-21T21:02:12Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1995-01	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/145214	-
dc.title	Measurement of lattice parameter of primary Si crystal in rheocast hypereutectic Al-Si alloy by convergent beam electron diffraction technique.	-
dc.title.alternative	수렴성빔 전자회절법을 이용한 리오캐스팅시킨 과공정 Al-Si 합금에서 실리콘초정의 격자상수 측정 =	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	한국전자현미경학회지 = Korean journal of electron microscopy, v.v. 25, no.no. 3, pp.99 - 107	-
dc.citation.title	한국전자현미경학회지 = Korean journal of electron microscopy	-
dc.citation.volume	v. 25	-
dc.citation.number	no. 3	-
dc.citation.startPage	99	-
dc.citation.endPage	107	-
dc.subject.keywordAuthor	hypereutectic Al-Si alloy	-

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