Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | LIU, CC | - |
dc.contributor.author | NA, BK | - |
dc.contributor.author | WALTERS, AB | - |
dc.contributor.author | VANNICE, MA | - |
dc.date.accessioned | 2024-01-21T21:42:15Z | - |
dc.date.available | 2024-01-21T21:42:15Z | - |
dc.date.created | 2022-01-11 | - |
dc.date.issued | 1994-01 | - |
dc.identifier.issn | 1011-372X | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/145657 | - |
dc.description.abstract | A microwave absorption technique based on cavity perturbation theory is shown to be applicable for electrical conductivity measurements of both a small, single-crystal particle and finely divided powder samples when sigma values fall in either the low (sigma < 0.1 OMEGA-1 cm-1) or the intermediate (0.1 less-than-or-equal-to sigma less-than-or-equal-to 100 OMEGA-1 cm-1) conductivity region. The results here pertain to semiconductors in the latter region. If the skin depth of the material becomes significantly smaller than the sample dimension parallel to the E-field, an appreciable error can be introduced into the calculated conductivity values; however, this discrepancy is eliminated by correcting for the field attenuation associated with the penetration depth of the microwaves. A modification of this approach utilizing the skin depth allows a first-order correction to be applied to powder samples which results in the accurate measurement of absolute sigma values, and results with doped Si powders are compared to a values obtained from one small single particle using this microwave technique as well as reported DC a values determined with single crystals. The use of this microwave absorption technique with small particles having high surface/volume ratios, such as catalyst supports and oxide catalysts, under controlled environments can provide fundamental information about adsorption and catalytic processes on such semiconductor surfaces. An application to a ZnO powder demonstrates this capability. | - |
dc.language | English | - |
dc.publisher | BALTZER SCI PUBL BV | - |
dc.subject | DOPANT DENSITY RELATIONSHIP | - |
dc.subject | DOPED SILICON | - |
dc.subject | CAVITY | - |
dc.subject | REGIME | - |
dc.subject | ESR | - |
dc.title | MICROWAVE-ABSORPTION MEASUREMENTS OF THE ELECTRICAL-CONDUCTIVITY OF SMALL PARTICLES | - |
dc.type | Article | - |
dc.identifier.doi | 10.1007/BF00824028 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | CATALYSIS LETTERS, v.26, no.1-2, pp.9 - 24 | - |
dc.citation.title | CATALYSIS LETTERS | - |
dc.citation.volume | 26 | - |
dc.citation.number | 1-2 | - |
dc.citation.startPage | 9 | - |
dc.citation.endPage | 24 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | A1994NL54900002 | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | DOPANT DENSITY RELATIONSHIP | - |
dc.subject.keywordPlus | DOPED SILICON | - |
dc.subject.keywordPlus | CAVITY | - |
dc.subject.keywordPlus | REGIME | - |
dc.subject.keywordPlus | ESR | - |
dc.subject.keywordAuthor | MICROWAVE ABSORPTION | - |
dc.subject.keywordAuthor | ELECTRICAL CONDUCTIVITY | - |
dc.subject.keywordAuthor | SINGLE CRYSTAL PARTICLES | - |
dc.subject.keywordAuthor | DOPED SI POWDERS | - |
dc.subject.keywordAuthor | ZNO POWDER | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.